Components Measurement and Evaluation Facilities

Laser Displacement Meter (non-contact type/contact type)
Measurement of Wafer Surface Defects (Warp, Undulation etc.), Height Measurement

Microscope
Simple Microscope

Precision Reflectometer
Measurement of Reflection Points

Optical Component Analyzer

Laser Sources

Optical Power Meter

ASE Light Sources

Optical Spectrum Analyzer

Wavemeter

Beam Profiler

RF Spectrum Analyzer

Pulse Pattern Generator

Function Generator

Impedence Analyzer

Oscilloscope

Fiber Polisher

Environmental Test Chamber System / Thermostatic Test Chamber System

Phone +81-551-26-0022 Contact US

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