Single Crystal Measurement and Evaluation Facilities

Spectrophotometer
Measurement of Absorption spectrum

DSC (Differential Scanning Calorimeter)
Measurement of Curie Temperature

Polarization Microscope
Inspection of Sub-grains and Inclusion in Crystal

Laue Camera
Measurement of Crystal Orientation

X-ray diffractometer
Confirm Crystallographic Orientation

Topography System
Analysis of Distribution and Pattern of Wafer Defects and Strain by Two-Dimensional Mapping (Image)

Schlieren Optical System
Checking Existence of Sub-grains Measurement of Refractive Index

Zygo Interferometer
Measurement of Wafer Surface Roughness and Internal Refractive Index

Refractometer
Measurement of Refractive Index and Birefringence for Crystal Block/Wafer

Phone +81-551-26-0022 Contact US

Home Sitemap Privacy Policy Contact Us Page Top