Si photodetector

Outline


S9295


Output noise
Log(Vrms/Hz 0.5) as a function of log(f)
At S=2.6V/nW,
integrated noise power =1pW (NEP)

Hamamatsu Photonics S9295

Growth path for 1/1000 time noise reduction

LPF(Hz)

33

3.3

0.33

NEP(fW)

200

20

2

Highest sensitivity(cd/m2)

2×10^-4 Integrating circuit

2×10^-5

2×10^-6 DMM

Temperature control issues

Dark current fluctuation due to the junction temperature fluctuation of S9295

Op-amp with low offset voltage temperature coefficient

Thermal EMF

Oxide Corporation

Speckle contrast Measurement System