Optical Device Measurement and Evaluation Facilities

Life-time Testing System
Long-term Reliability Testing for Non-Linear Frequency Conversion Devices such as QPM

Characterization System for QPM Waveguide
Characterization of Phase-Matched Wavelength, Conversion Efficiency, and Guided Mode Profile for QPM (PPMgLN) Waveguide

Optical Lossmeter
LossPro™ System by NovaWave Technologies,Inc. / Measurement of Optical device Loss (1064,532,355 nm)

Photo-Thermal Common Path Interferometer
PCI-3 System by Stanford Photo-Thermal Solutions / Evaluation of Laser Absorption of Optical Materials and Wafers

Phone +81-551-26-0022 Contact US

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