Components Measurement and Evaluation Facilities

Laser Displacement Meter (non-contact type/contact type)

  Measurement of Wafer Surface Defects (Warp, Undulation etc.), Height Measurement


  Simple Microscope

Precision Reflectometer

  Measurement of Reflection Points

Optical Component Analyzer

Laser Sources

Optical Power Meter

ASE Light Sources

Optical Spectrum Analyzer


Beam Profiler

RF Spectrum Analyzer

Pulse Pattern Generator

Function Generator

Impedence Analyzer


Fiber Polisher

Environmental Test Chamber System / Thermostatic Test Chamber System